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Effective electron mobility in Si inversion layers in metal–oxide–semiconductor systems with a high-κ insulator: The role of remote phonon scattering

✍ Scribed by Fischetti, Massimo V.; Neumayer, Deborah A.; Cartier, Eduard A.


Book ID
111874144
Publisher
American Institute of Physics
Year
2001
Tongue
English
Weight
604 KB
Volume
90
Category
Article
ISSN
0021-8979

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