Effective defect detection in thin film transistor liquid crystal display images using adaptive multi-level defect detection and probability density function

✍ Scribed by Se-Yun Kim; Young-Chul Song; Chang-Do Jung; Kil-Houm Park

• Book ID: 106256030
• Publisher: Optical Society of Japan
• Year: 2011
• Tongue: English
• Weight: 1009 KB
• Volume: 18
• Category: Article
• ISSN: 1340-6000
• DOI: 10.1007/s10043-011-0041-z