✦ LIBER ✦
Effect of ZrO[sub x]/HfO[sub x] bilayer structure on switching uniformity and reliability in nonvolatile memory applications
✍ Scribed by Lee, Joonmyoung; Bourim, El Mostafa; Lee, Wootae; Park, Jubong; Jo, Minseok; Jung, Seungjae; Shin, Jungho; Hwang, Hyunsang
- Book ID
- 120395281
- Publisher
- American Institute of Physics
- Year
- 2010
- Tongue
- English
- Weight
- 746 KB
- Volume
- 97
- Category
- Article
- ISSN
- 0003-6951
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