✦ LIBER ✦
Effect of well and substrate parameters on the latchup degradation of CMOS structures during e-beam voltage contrast measurements
✍ Scribed by F.M. Roche; S.D. Bocus; P. Girard
- Publisher
- Elsevier Science
- Year
- 1991
- Tongue
- English
- Weight
- 174 KB
- Volume
- 15
- Category
- Article
- ISSN
- 0167-9317
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