Effect of weak uniform frustration on the resistive transition in a Josephson junction array

✍ Scribed by John P. Carini; Sidney R. Nagel; Riccardo Levi-Setti; Yuh-Lin Wang; Jan Chabala; Geoffrey Crow

• Publisher: Elsevier Science
• Year: 1988
• Tongue: English
• Volume: 65
• Category: Article
• ISSN: 0038-1098
• DOI: 10.1016/0038-1098(88)90741-7