✦ LIBER ✦
Effect of uncertainty in failure rates on memory system reliability : Hassanein Hamed Amer and Ravishankar Krishnan Iyer. IEEE Trans. Reliab. R-35 (4), 377 (1986)
- Publisher
- Elsevier Science
- Year
- 1987
- Tongue
- English
- Weight
- 133 KB
- Volume
- 27
- Category
- Article
- ISSN
- 0026-2714
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