Effect of thermal annealing and strain engineering on the fine structure of quantum dot excitons

✍ Scribed by Tartakovskii, A. I.; Makhonin, M. N.; Sellers, I. R.; Cahill, J.; Andreev, A. D.; Whittaker, D. M.; Wells, J-P. R.; Fox, A. M.; Mowbray, D. J.; Skolnick, M. S.; Groom, K. M.; Steer, M. J.; Liu, H. Y.; Hopkinson, M.

• Book ID: 125885787
• Publisher: The American Physical Society
• Year: 2004
• Tongue: English
• Weight: 235 KB
• Volume: 70
• Category: Article
• ISSN: 1098-0121
• DOI: 10.1103/PhysRevB.70.193303