Effect of the structural quality of the buffer on the magnetoresistance and the exchange coupling in sputtered Co/Cu sandwiches
β Scribed by A. Dinia; N. Persat; S. Colis; C. Ulhaq-Bouillet; H.A.M. van den Berg
- Publisher
- Springer
- Year
- 2000
- Tongue
- English
- Weight
- 730 KB
- Volume
- 18
- Category
- Article
- ISSN
- 1434-6036
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π SIMILAR VOLUMES
We have studied the influence of the Pb buffer layer thickness in the Co/Cu multilayers on the magnetoresistance of the system. Co/Cu multilayers (ML) were thermally evaporated at very low deposition rates on Si substrates covered with Pb buffer layer of different thickness (5, 10, 20, 30, 40 nm). T
A study of the variation of the magnetoresistance in radio frequency magnetron sputtered CoFe/Cu/NiFe tri-layered thin films with thickness t Cu and substrate temperature (T s ) is performed. The magnetoresistance is measured for fields applied parallel to the current at room temperature. The depend