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Effect of the Madelung potential on surface core-level shifts in GaAs

✍ Scribed by J.W. Davenport; R.E. Watson; M.L. Perlman; T.K. Sham


Publisher
Elsevier Science
Year
1981
Tongue
English
Weight
420 KB
Volume
40
Category
Article
ISSN
0038-1098

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X-ray photoelectron spectroscopy has been used to study 20, 100 and 1000 nm evaporated cerium oxide films on Si(100) single-crystal wafers. Upon exposure to the x-ray source there was loss of oxygen and generation of Ce3+. Furthermore, for the 20 nm coating, there was evidence of a shift to higher b