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Effect of the low-temperature heating on formation and evolution of defects in PHEMT AlGaAs/InGaAs structures exposed by CF4 plasma

✍ Scribed by T.S. Shamirzaev; K.S. Zhuravlev; A.I. Toropov; A.K. Bakarov


Publisher
Elsevier Science
Year
2003
Tongue
English
Weight
292 KB
Volume
340-342
Category
Article
ISSN
0921-4526

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