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Effect of surface roughness on adhesion of graphene membranes

โœ Scribed by Gao, Wei; Huang, Rui


Book ID
127309612
Publisher
Institute of Physics
Year
2011
Tongue
English
Weight
210 KB
Volume
44
Category
Article
ISSN
0022-3727

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Atomic force microscopy in conjunction with the colloid (silica) probe technique has been used to quantify the variations in electrical double-layer interactions and adhesion at different locations on a rough reverse osmosis membrane (AFC99) surface in NaCl solutions. Prior scanning of the membrane