Atomic Force Microscopy Studies of Membr
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W. Richard Bowen; Teodora A. Doneva
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Article
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2000
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Elsevier Science
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English
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Atomic force microscopy in conjunction with the colloid (silica) probe technique has been used to quantify the variations in electrical double-layer interactions and adhesion at different locations on a rough reverse osmosis membrane (AFC99) surface in NaCl solutions. Prior scanning of the membrane