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Effect of surface fields on the breakdown voltage of planar silicon p-n junctions : Andrew S. Grove, Otto Leistiko, Jr. and William W. Hooper, IEEE Trans.ED-14, No. 3, March (1967), p. 157.


Publisher
Elsevier Science
Year
1967
Tongue
English
Weight
202 KB
Volume
6
Category
Article
ISSN
0026-2714

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