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Effect of substrate orientation on critical thickness of Cu thin films

✍ Scribed by Na Pang; Leng Chen


Book ID
107702296
Publisher
The Korean Institute of Metals and Materials
Year
2011
Tongue
English
Weight
279 KB
Volume
7
Category
Article
ISSN
1738-8090

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Critical thickness of microscopic thin l
✍ Emil D. Manev; Anh V. Nguyen πŸ“‚ Article πŸ“… 2005 πŸ› Elsevier Science 🌐 English βš– 323 KB

This paper outlines the progress achieved during the four decades of research on the spontaneous destruction of the thinning microscopic liquid films through rupture or black spot formation at the so-called critical thickness. Although most of both experimental and theoretical results are primarily