✦ LIBER ✦
Effect of stress on the carrier generation rate in gold-doped silicon : J. L. Prince, J. J. Wortman, L. K. Montieth and J. R. Hauser, Solid-State Electron. 13 (1970), p. 1519
- Publisher
- Elsevier Science
- Year
- 1971
- Tongue
- English
- Weight
- 116 KB
- Volume
- 10
- Category
- Article
- ISSN
- 0026-2714
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