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Effect of SiO2 on charge transfer at the zirconia/electrode interface

โœ Scribed by D. Gozzi; M. Tomellini; A. Bianconi; M. Fanfoni


Publisher
Elsevier Science
Year
1986
Weight
613 KB
Volume
198
Category
Article
ISSN
0022-0728

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Ab initio Calculation on Atomic Structur
โœ Qiang Wang; C.G. Pantano; J.F. Annett ๐Ÿ“‚ Article ๐Ÿ“… 1999 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 136 KB ๐Ÿ‘ 2 views

The atomic structure and structural stabilities of silicon oxycarbide SiO x C y phase formed at the SiC/SiO 2 interface were studied using ab initio pseudopotential method. The total energies and the cohesive energies of the SiO x C y at different composition: SiC, SiO 1/4 C 3/4 , SiO 1/2 C 1/2 , Si