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Effect of RTCVD growth conditions on the crystal quality of pseudomorphic Si1-x-yGexCy films

โœ Scribed by Jian Mi; Patricia Warren; Pascal Letourneau; Moshe Judelewicz; Marc Gailhanou; Michel Dutoit


Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
346 KB
Volume
157
Category
Article
ISSN
0022-0248

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