Effect of reliability programs on life cycle cost—a case history : Roland G. Bertschy. Microelectron. Reliab. 17, 9 (1978)

• Publisher: Elsevier Science
• Year: 1978
• Tongue: English
• Weight: 127 KB
• Volume: 17
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(78)90364-5