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Effect of rapid continuous annealing on the structure and properties of automobile sheet

✍ Scribed by I. A. Mustafaev; L. N. Gresskii; I. S. Antonova

Publisher
Springer US
Year
1987
Tongue
English
Weight
186 KB
Volume
31
Category
Article
ISSN
0026-0894

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## Abstract The effects of rapid thermal annealing on the electrical and structural properties of Ru/n‐InP Schottky diode have been investigated by current–voltage (__I__–__V__), capacitance–voltage (__C__–__V__), X‐ray diffraction (XRD) and secondary ion‐mass spectroscopy (SIMS) techniques. Result