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Effect of primary beam energy on the secondary-ion sputtering efficiency of liquid secondary-ionization mass spectrometry in the 5-30-keV range

✍ Scribed by Aberth, William H.; Burlingame, A. L.

Book ID: 126871149
Publisher: American Chemical Society
Year: 1988
Tongue: English
Weight: 321 KB
Volume: 60
Category: Article
ISSN: 0003-2700
DOI: 10.1021/ac00165a016

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