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Effect of point defects on the recombination activity of copper precipitates inp-type Czochralski silicon

✍ Scribed by Weiyan Wang; Deren Yang; Xuegong Yu; Duanlin Que

Publisher: Springer US
Year: 2008
Tongue: English
Weight: 277 KB
Volume: 19
Category: Article
ISSN: 0957-4522
DOI: 10.1007/s10854-007-9507-y

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