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Effect of oxygen pressure on the structural and magnetic properties of thin Zn 0.98 Mn 0.02 O films

✍ Scribed by Khodorov, A.; Rolo, A.G.; Hlil, E.K.; Ayres de Campos, J.; Karzazi, O.; Levichev, S.; Correia, M.R.; Chahboun, A.; Gomes, M.J.M.

Book ID
120414229
Publisher
EDP Sciences
Year
2011
Tongue
English
Weight
859 KB
Volume
57
Category
Article
ISSN
1286-0042

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## Abstract Cr‐doped ZnO thin films have been prepared on silicon substrates by magnetron sputtering method. The effects of annealing on the compositions, crystallographic structures, and optical properties of the thin films are systematically investigated by energy dispersive spectroscopy, X‐ray d