Substrate photoelectron enhancement of c
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Brizzolara, Robert A.; Beard, Bruce C.
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Article
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1999
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John Wiley and Sons
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English
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The Ebel Model, which characterizes a sample consisting of a thin carbonaceous overlayer on a substrate of a different material, provides a relationship between the carbon 1s and Auger peak intensities and the overlayer thickness. In this paper, Ebel model predictions for six substrate materials (si