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Effect of O-vacancy defects on the Schottky barrier heights in Ni/SiO2 and Ni/HfO2 interfaces

โœ Scribed by Hyeon-Kyun Noh; Young Jun Oh; K.J. Chang


Book ID
116833943
Publisher
Elsevier Science
Year
2012
Tongue
English
Weight
576 KB
Volume
407
Category
Article
ISSN
0921-4526

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