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Effect of N[sub 2] dielectric barrier discharge treatment on the composition of very thin SiO[sub 2]-like films deposited from hexamethyldisiloxane at atmospheric pressure

✍ Scribed by Reuter, R.; Gherardi, N.; Benedikt, J.


Book ID
118020857
Publisher
American Institute of Physics
Year
2012
Tongue
English
Weight
646 KB
Volume
101
Category
Article
ISSN
0003-6951

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