Effect of NA-light radiation on the optical gap and crystal structure of AgNO3-diffused PVDF sensor
✍ Scribed by A. Tawansi; A. H. Oraby; E. Ahmed; E. M. Abdelrazek; M. Abdelaziz
- Publisher
- John Wiley and Sons
- Year
- 1998
- Tongue
- English
- Weight
- 246 KB
- Volume
- 70
- Category
- Article
- ISSN
- 0021-8995
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✦ Synopsis
A casting method was used to prepare polyvinylidene fluoride (PVDF) and 1 wt % MnCl 2 -filled PVDF films. AgNO 3 was allowed to diffuse through the filled films. The 3 types of the prepared films were irradiated by Na light with various doses. The post-irradiation and relaxation effects were investigated using ultraviolet-visible spectroscopy, X-ray analysis, and optical microscopy. The results were interpreted on the bases of a theoretical model previously suggested for a build-up and decay of radiationinduced conductivity associated with the transition of charge carriers in the presence of a uniform trap distribution. Various structures were proposed for the diffused AgNO 3 before and after irradiation. It was found that the induced change in optical gap, due to 5-min irradiation time for the AgNO 3 diffused films, exhibits no relaxation phenomenon. Accordingly, this film can be used in photorecording applications.