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Effect of mold compound components on moisture-induced degradation of gold-aluminum bonds in epoxy encapsulated devices : Anthony A. Gallo. 28th A. Proc. Reliab. Phys. Symp. (IEEE), 244 (March 1990)


Book ID
103283026
Publisher
Elsevier Science
Year
1991
Tongue
English
Weight
125 KB
Volume
31
Category
Article
ISSN
0026-2714

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