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Effect of memory electrical switching in metal/vanadium oxide/silicon structures with VO2 films obtained by the sol–gel method

✍ Scribed by Velichko, А.; Pergament, A.; Putrolaynen, V.; Berezina, O.; Stefanovich, G.


Book ID
124133601
Publisher
Elsevier Science
Year
2015
Tongue
English
Weight
680 KB
Volume
29
Category
Article
ISSN
1369-8001

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