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Effect of low-temperature interphase charge transport at the Si/SiO2interface on the photoresponse of silicon barrier structures

✍ Scribed by N. I. Bochkareva; S. A. Khorev

Book ID: 110125026
Publisher: Springer
Year: 2000
Tongue: English
Weight: 110 KB
Volume: 34
Category: Article
ISSN: 1063-7826
DOI: 10.1134/1.1317579

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