Effect of low constant current stress treatment on the performance of the Cu/ZrO 2 /Pt resistive switching device

✍ Scribed by Xie, Hongwei; Liu, Qi; Li, Yingtao; Lv, Hangbing; Wang, Ming; Zhang, Kangwei; Long, Shibing; Liu, Su; Liu, Ming

• Book ID: 121453422
• Publisher: Institute of Physics
• Year: 2012
• Tongue: English
• Weight: 469 KB
• Volume: 27
• Category: Article
• ISSN: 0268-1242
• DOI: 10.1088/0268-1242/27/10/105007