Effect of Localized Stress on Power Loss in (110) [001] Si-Fe with Law Thickness

✍ Scribed by Takeda, K.; Ueda, F.; Yamaguchi, T.

• Book ID: 119817757
• Publisher: Institute of Electrical and Electronics Engineers
• Year: 1985
• Weight: 225 KB
• Volume: 1
• Category: Article
• ISSN: 0882-4959
• DOI: 10.1109/tjmj.1985.4548827