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Effect of Length Scale on Critical Current Measurement in High Temperature Superconductor Wires

✍ Scribed by Gannon, J. J.; Malozemoff, A. P.; Diehl, R. C.; Antaya, P.; Mori, A.

Book ID
120585685
Publisher
IEEE
Year
2013
Tongue
English
Weight
462 KB
Volume
23
Category
Article
ISSN
1051-8223

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