Effect of iron contamination on grain boundary states at a direct silicon bonded (110)/(100) interface

✍ Scribed by Xiaoqiang Li; Xuegong Yu; Dong Lei; Deren Yang; George Rozgonyi

• Book ID: 112183069
• Publisher: John Wiley and Sons
• Year: 2010
• Tongue: English
• Weight: 207 KB
• Volume: 4
• Category: Article
• ISSN: 1862-6254
• DOI: 10.1002/pssr.201004356