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Effect of ion energy upon dielectric breakdown of the capacitor response in vertical power MOSFETs

โœ Scribed by Titus, J.L.; Wheatley, C.F.; Van Tyne, K.M.; Krieg, J.F.; Burton, D.I.; Campbell, A.B.


Book ID
125491488
Publisher
IEEE
Year
1998
Tongue
English
Weight
728 KB
Volume
45
Category
Article
ISSN
0018-9499

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