## Abstract We have grown by molecular beam epitaxy (MBE) 300 Γ Fe films on single crystal MgO(001) substrates with Ag buffer layer with a thickness varying from 0 to 150 Γ . The epitaxial growth and structure quality of the films were verified by reflection highβenergy electron diffraction (RHEED)
β¦ LIBER β¦
Effect of Interface Roughness on Perpendicular Magnetic Anisotropy of Fe/Tb Multilayers
β Scribed by Amitesh Paul; Ajay Gupta; Prasanna Shah; K. Kawaguchi; G. Principi
- Book ID
- 110405761
- Publisher
- Springer
- Year
- 2002
- Tongue
- English
- Weight
- 181 KB
- Volume
- 139/140
- Category
- Article
- ISSN
- 0304-3843
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