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Effect of imprint on operation and reliability of ferroelectric random access memory (FeRAM)

✍ Scribed by Inoue, N.; Hayashi, Y.

Book ID: 114538864
Publisher: IEEE
Year: 2001
Tongue: English
Weight: 147 KB
Volume: 48
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.954465

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