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Effect of high-temperature H2-anneals on the slow-trapping instability of MOS structures : A. K. Sinha, H. J. Levinstein, L. P. Adda, E. N. Fuls and E. I. Povilonis. Solid-St. Electron. 21, 531 (1978)


Publisher
Elsevier Science
Year
1978
Tongue
English
Weight
248 KB
Volume
17
Category
Article
ISSN
0026-2714

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