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Effect of high field stresses on interface states of n-MOS capacitors

✍ Scribed by M. Jourdain; G. Salace; C. Petit; M. Favre; J. Despujols; V. Le Goascoz


Publisher
Elsevier Science
Year
1983
Tongue
English
Weight
453 KB
Volume
26
Category
Article
ISSN
0038-1101

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