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Effect of high-energy electron beam irradiation on the gate-bias stability of IGZO TFTs

โœ Scribed by Hye Ji Moon; So Hyun Jung; Min Ki Ryu; Kyoung Ik Cho; Eui-Jung Yun; Byung Seong Bae


Book ID
119936884
Publisher
The Korean Physical Society
Year
2012
Tongue
English
Weight
347 KB
Volume
60
Category
Article
ISSN
0374-4884

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