Effect of high current density on the admittance response of interface states in ultrathin MIS tunnel junctions

✍ Scribed by Godet, Christian; Fadjie-Djomkam, Alain-Bruno; Ababou-Girard, Soraya

• Book ID: 123288980
• Publisher: Elsevier Science
• Year: 2013
• Tongue: English
• Weight: 898 KB
• Volume: 80
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/j.sse.2012.10.012