✦ LIBER ✦
Effect of Heat Diffusion During State Transitions in Resistive Switching Memory Device Based on Nickel-Rich Nickel Oxide Film
✍ Scribed by Hu, S.G.; Liu, Y.; Chen, T.P.; Zhen Liu; Ming Yang; Qi Yu; Fung, S.
- Book ID
- 114620908
- Publisher
- IEEE
- Year
- 2012
- Tongue
- English
- Weight
- 516 KB
- Volume
- 59
- Category
- Article
- ISSN
- 0018-9383
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