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Effect of $\hbox{SiN}_{x}$ Gate Dielectric Deposition Power and Temperature on a-Si:H TFT Stability
✍ Scribed by A. Z. Kattamis; K. H. Cherenack; B. Hekmatshoar; I. Cheng; H. Gleskova; J. C. Sturm; S. Wagner
- Book ID
- 126734389
- Publisher
- IEEE
- Year
- 2007
- Tongue
- English
- Weight
- 223 KB
- Volume
- 28
- Category
- Article
- ISSN
- 0741-3106
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