Effect of $\hbox{Ge}_{2}\hbox{Sb}_{2}\hbox{Te}_{5}$ Thermal Barrier on Reset Operations in Filament-Type Resistive Memory

✍ Scribed by W. Lee; M. Siddik; S. Jung; J. Park; S. Kim; J. Shin; J. Lee; S. Park; M. Son; H. Hwang

• Book ID: 126676804
• Publisher: IEEE
• Year: 2011
• Tongue: English
• Weight: 419 KB
• Volume: 32
• Category: Article
• ISSN: 0741-3106
• DOI: 10.1109/LED.2011.2163614