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Effect of grain boundary on electrical properties of polycrystalline lanthanum nickel oxide thin films

✍ Scribed by Zhu, M. W.; Wang, Z. J.; Chen, Y. N.; Wang, H. L.; Zhang, Z. D.

Book ID: 120542833
Publisher: Springer
Year: 2012
Tongue: English
Weight: 928 KB
Volume: 112
Category: Article
ISSN: 1432-0630
DOI: 10.1007/s00339-012-7466-5

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