Effect of ferroelectric polarization on insulated-gate thin-film transistor parameters : R. Zuleeg and H. H. Wieder, Solid St. Electron., 9 (1966), p. 657

• Publisher: Elsevier Science
• Year: 1967
• Tongue: English
• Weight: 93 KB
• Volume: 6
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(67)90250-8