๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Effect of electric current on migration of point defects near a crack tip

โœ Scribed by D. N. Karpinskii; S. V. Sannikov


Book ID
110314559
Publisher
SP MAIK Nauka/Interperiodica
Year
2001
Tongue
English
Weight
190 KB
Volume
42
Category
Article
ISSN
0021-8944

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES


Effect of a hole near a crack tip on the
โœ Chen Yi-Heng ๐Ÿ“‚ Article ๐Ÿ“… 1986 ๐Ÿ› Springer Netherlands ๐ŸŒ English โš– 155 KB

A partitioning plan combined with the generalized variational method is presented for studying the effect of a hole near a crack tip on the stress intensity factor. The hole is at an arbitrary distance relative to the crack tip and the influence of the distance is determined numerically. Consider