✦ LIBER ✦
Effect of CVD-SiO2 film on reliability of GaAs MESFET with Ti/Pt/Au gate metal
✍ Scribed by Saito, Y.; Hashinaga, T.; Nakajima, S.
- Book ID
- 114668316
- Publisher
- IEEE
- Year
- 2005
- Tongue
- English
- Weight
- 408 KB
- Volume
- 54
- Category
- Article
- ISSN
- 0018-9529
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