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Effect of Cu contamination on recombination of O atoms on a plasma-oxidized silicon surface

โœ Scribed by Guha, Joydeep; Khare, Rohit; Stafford, Luc; Donnelly, Vincent M.; Sirard, Stephen; Hudson, Eric A.


Book ID
121259626
Publisher
American Institute of Physics
Year
2009
Tongue
English
Weight
626 KB
Volume
105
Category
Article
ISSN
0021-8979

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