✦ LIBER ✦
Effect of Crystal Orientation on Imaging Contrast and Sputter Results during Focused Ion Beam Milling of Cu studied by FIB, EBSD, SEM, and AFM
✍ Scribed by Wendt, U; Nolze, G; Heyse, H
- Book ID
- 120689089
- Publisher
- Cambridge University Press
- Year
- 2006
- Tongue
- English
- Weight
- 382 KB
- Volume
- 12
- Category
- Article
- ISSN
- 1431-9276
No coin nor oath required. For personal study only.