The structural, electrical and optical properties of AgGa(Se 0.5 S 0.5 ) 2 thin films deposited by using the thermal evaporation method have been investigated as a function of annealing in the temperature range of 450-600 ยฐC. X-ray diffraction (XRD) analysis showed that the structural transformation
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Effect of copper doping on the electrical and optical properties of (Zn0.4Cd0.6)S films sintered with CdCl2
โ Scribed by P.K. Patil; J.K. Nandgave; R.D. Lawangar-Pawar
- Publisher
- Elsevier Science
- Year
- 1990
- Tongue
- English
- Weight
- 206 KB
- Volume
- 74
- Category
- Article
- ISSN
- 0038-1098
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